Navigation auf uzh.ch
This advanced microscopy course is intended for PhD students and post-graduates with prior experience in microscopy. The goal of the course is to teach and train fundamental knowledge and skills in a specific microscopic technique. Subsequently, students should be able to apply the knowledge in their own present and future projects. Practical work consists of five different modules each covering a specific topic (please see description below). Each practical module lasts the entire duration of the course. Students will participate in one module only and use state-of-the-art instrumentation. Theoretical sessions will cover basic and advanced knowledge about all the different techniques and topics.
The course is jointly organised by the Center for Microscopy and Image Analysis (ZMB, University of Zurich) and the Scientific Center for Optical and Electron Microscopy (ScopeM, ETHZ)
500 CHF.
Note: The course fees do not cover lunch, except dinner on Thursday evening and beverages and snacks provided during breaks.
The Winter School is valued with 2-3 ECTS credits (depending on the institution).
In this module, you will learn how to select the most appropriate advanced light microscopy technique such as confocal laser scanning, multiphoton or super resolution (STED) microscopy for your project. Lectures will teach you to understand resolution, multicolor fluorescence acquisition, aberrations and deconvolution in light microscopy. Practical trainings to apply the concepts from lectures will be on advanced widefield, confocal laser scanning, multiphoton, and super resolution microscopes with cell and tissue samples for multicolor and 3D imaging.
Contact: Dr. Jana Döhner, Center for Microscopy and Image Analysis, University of Zurich
(jana.doehner@zmb.uzh.ch, +41 44 635 06 24)
Learning outcomes:
By the end of the module, you should be able to
Practical activities:
Prerequisites:
In this module, you will learn how to identify the most appropriate super-resolution light microscopy technique to address your specific needs and sample. Numerous super-resolution or “quasi” super-resolution methods will be covered including
and “quasi” super-resolution methods like
Lectures will teach you to understand resolution and the various concepts of resolution enhancement that serve as theoretical basis for the different super-resolution methods. In the practical sessions you will work with the various super-resolution instruments of ScopeM and learn about all the advantages/disadvantages of the different methods, both in terms of imaging and sample preparation possibilities.
Contact: Dr. Gabor Csucs, ScopeM, ETHZ
(gabor.csucs@scopem.ethz.ch, +41 44 633 62 21)
Learning outcomes:
Practical activities:
Prerequisites:
In this module, you will learn how to prepare biological specimens for 2D and 3D electron microscopy techniques such as serial-section transmission and scanning electron microscopy, focused ion beam and serial block-face scanning electron microscopy. To preserve the sample ultra-structure, chemical and cryo-fixation techniques (high-pressure freezing, freeze-substitution) will be used. Subsequently, resin-embedded samples will be sectioned by ultramicrotomy and imaged by transmission, scanning and focused ion beam scanning electron microscopy. The cellular ultra-structure in the resulting micrographs will be reviewed in context to preparation. Samples will be provided.
Contact: Dr. Andres Kaech, Center for Microscopy and Image Analysis, University of Zurich
(andres.kaech@zmb.uzh.ch, +41 44 634 26 65)
Learning outcomes:
Practical activities:
Prerequisites:
Correlative Light and Electron Microscopy (CLEM) combines the best of two worlds: large-scale imaging using light microscopy and high-resolution electron microscopy. This module covers the basics of methodology and preparation techniques needed to perform light and electron microscopic investigations on identical sample areas. Starting with imaging of living cells, we will in the following prepare these samples for EM, and acquire focused-ion beam SEM (FIB-SEM) and serial blockface SEM (SBF-SEM) data of the exact same cells. You will learn to relocate a previously imaged region of interest in the EM, collect correlative 3D data sets and get an understanding of the different image characteristics. The practical work will be rounded off by image processing sessions, covering the basics of post-processing of volume data, aligning the acquired LM and EM data in 3D, visualizing the correlation, and creation of 3D models. Samples will be provided.
Contact: Dr. Miriam Lucas, ScopeM, ETHZ
(miriam.lucas@scopem.ethz.ch, +41 44 633 4424)
Learning outcomes:
Practical activities:
Prerequisites:
The third dimension is of utmost importance for understanding the complex structural context of specimen, in biology as well as in material sciences. This module provides an overview and compares scanning electron microscopy (SEM)-based techniques for volume imaging: (1) focused ion beam-SEM (FIB-SEM), (2) serial blockface SEM (SBF-SEM) and (3) array tomography. For the first two methods, a fresh blockface is created in situ in the SEM employing either a focused ion beam, or a diamond knife respectively, and volume data is acquired by alternating cutting and imaging of the fresh blockface. For array tomography on the other hand, ribbons of sections (i.e. serial sections) are imaged. These are prepared using conventional ultramicrotomy and mounted onto a conductive support for SEM. We will acquire 3D data of the same sample type using all three techniques, and cover the methodology and sample preparation techniques for the respective methods. The module will be rounded off by image processing sessions covering the basics of post-processing of volume data, visualization and 3D modelling of structures of interest. Samples will be provided.
Contact: Dr. Miriam Lucas, ScopeM, ETHZ
(miriam.lucas@scopem.ethz.ch, +41 44 633 4424)
Learning outcomes:
Practical activities:
Prerequisites: