SEM - Jeol JSM-IT700HR (Irchel)
The SEM - Jeol JSM-IT700HR is a field emission scanning electron microscope equipped with secondary and backscattered electron detectors, as well as an integrated EDX detector. The system can be operated in variable pressure mode (air) to reduce charging or image non-conductive specimens.
Location
University Zurich, Irchel Y42-H-93.
Training Request
Follow this link to apply for an introduction to the microscope.
Technical Specifications
Electron column
InLens Schottky field emission gun.
Double condensor system.
Acceleration voltage: 0.5 - 30 kV.
Resolution of 1 nm at 20 kV and 3 nm at 1 kV.
Detector Systems
Everhart-Thornley type SE detector in chamber (with REF mode: energy-filtered SE detection).
Low vacuum SE detector.
Backscattered electron detector (BSE).
Jeol Dry SD30 EDS detector (30 mm2).
Accessories
Fully motorized heavy duty sample stage with eucentric tilt and rotation
for samples of up to ≥ 20 cm Ø and ≥ 2 kg weight
System controls
Jeol user interface and control software.
Responsible Persons
If you have questions about the device please contact the responsible person.
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