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Center for Microscopy and Image Analysis

Electron microscopes

The following electron microscopes are available at the Center for Microscopy and Image Analysis

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  • FIB-SEM - Zeiss Auriga 40 CrossBeam (Irchel)
    The focused ion beam-scanning electron microscope (FIB-SEM) Auriga 40 is a multi-approach instrument to investigate sample volume at nanoscale resolution. The ATLAS 3D package, especially dedicated for nanotomography, allows generation of 3D stacks up to 32 k x 32 k pixels.
  • SEM - Zeiss GeminiSEM 450 (Irchel)
    The Zeiss Supra 50 VP is a field emission scanning electron microscope equipped with secondary, backscattered electron and EDX detectors. The system can be operated in variable pressure mode using N2 gas to reduce charging or image non-conductive specimens.
  • SEM - Jeol JSM-IT700HR (Irchel)
    The JEOL JSM-6010 is a tungsten cathode scanning electron microscope equipped with secondary, backscattered and secondary electron detectors, cathode luminescence and EDX detector. The system can be operated in variable pressure mode (air) to reduce charging or image non-conductive specimens.
  • SEM - FEI Apreo VS (Irchel)
    The FEI Tecnai G2 Spirit is a 120 kV transmission electron microscope equipped with two digital CCD cameras for image acquisition and diffraction analysis, scanning transmission electron microsopy option with corresponding detector, as well as Oxford EDX system for elemental analysis.
  • TEM - FEI Tecnai G2 Spirit (Irchel)
    The FEI Tecnai G2 Spirit is a 120 kV transmission electron microscope equipped with two digital CCD cameras for image acquisition and diffraction analysis, scanning transmission electron microsopy option with corresponding detector, as well as Oxford EDX system for elemental analysis.
  • TEM - FEI Talos 120 (Irchel)
    The FEI Tecnai G2 Spirit is a 120 kV transmission electron microscope equipped with two digital CCD cameras for image acquisition and diffraction analysis, scanning transmission electron microsopy option with corresponding detector, as well as Oxford EDX system for elemental analysis.
  • TEM - FEI Titan Krios (Irchel)
    The FEI Titan Krios is a 300 kV transmission electron microscope dedicated for analysis of frozen hydrated samples (cryo electron tomography) equipped with a Gatan Quantum Energy Filter with a K2 direct detection camera for image acquisition (4k x 4k pixels).
  • TEM - Thermo Fisher Titan Krios G3i (Irchel)
    The FEI Titan Krios G3i is a 300 kV transmission electron microscope dedicated for analysis of frozen hydrated samples (cryo electron tomography and single particle cryo electron microscopy) equipped with a Gatan BioQuantum Energy Filter and a K3 direct detection camera for image acquisition (6k x 4k pixels).
  • TEM - Thermo Fisher Glacios G2 (Irchel)
    The Thermo Fisher Glacios G2 is a 200 kV transmission electron microscope dedicated for analysis of frozen hydrated samples. The instrument is equipped with a Flacon 4i direct detection camera for image acquisition (4k x 4k pixels).

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